768 search results - page 152 / 154 » Robustness of Sequential Circuits |
MICRO
2008
IEEE
14 years 1 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
Process variations will greatly impact the stability, leakage power consumption, and performance of future microprocessors. These variations are especially detrimental to 6T SRAM ...
ISPD
2006
ACM
14 years 1 months ago
2006
ACM
The multilevel placement package mPL6 combines improved implementations of the global placer mPL5 (ISPD05) and the XDP legalizer and detailed placer (ASPDAC06). It consistently pr...
GECCO
2004
Springer
14 years 25 days ago
2004
Springer
In this paper, we consider a variation of the Euclidean Steiner Tree Problem in which the space underlying the set of nodes has a specified non-uniform cost structure. This proble...
DNA
2000
Springer
13 years 11 months ago
2000
Springer
Multicellular organisms create complex patterned structures from identical, unreliable components. Learning how to engineer such robust behavior is important to both an improved un...