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» Robustness of Sequential Circuits

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DATE
2003
IEEE

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Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG

14 years 2 months ago

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Hideyuki Ichihara, Tomoo Inoue

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ISQED
2003
IEEE

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Leakage Current Reduction in Sequential Circuits by Modifying the Scan Chains

14 years 2 months ago

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Afshin Abdollahi, Farzan Fallah, Massoud Pedram

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IOLTS
2002
IEEE

103views Hardware» more IOLTS 2002»

Sequential Circuits Applicable for Detecting Different Types of Faults

14 years 1 months ago

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Ilya Levin, Vladimir Sinelnikov, Mark G. Karpovsky...

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GLVLSI
1999
IEEE

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A Correlation Matrix Method of Clock Partitioning for Sequential Circuit Testability

14 years 1 months ago

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Yong Chang Kim, Kewal K. Saluja, Vishwani D. Agraw...

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GLVLSI
1999
IEEE

92views VLSI» more GLVLSI 1999»

Pseudo-Exhaustive Testing of Sequential Circuits

14 years 1 months ago

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