As robots and humans move towards sharing the same environment, the need for safety in robotic systems is of growing importance. Towards this goal of human-friendly robotics, a rob...
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
In this paper we introduce a new method of performing direct solution of the harmonic balance Jacobian. For examples with moderate number of harmonics and moderate to strong nonli...
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...