768 search results - page 66 / 154 » Robustness of Sequential Circuits |
ICRA
2010
IEEE
13 years 6 months ago
2010
IEEE
As robots and humans move towards sharing the same environment, the need for safety in robotic systems is of growing importance. Towards this goal of human-friendly robotics, a rob...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
DAC
2006
ACM
14 years 2 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
DAC
2009
ACM
14 years 9 months ago
2009
ACM
In this paper we introduce a new method of performing direct solution of the harmonic balance Jacobian. For examples with moderate number of harmonics and moderate to strong nonli...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...