Data center power infrastructure incurs massive capital costs, which typically exceed energy costs over the life of the facility. To squeeze maximum value from the infrastructure,...
Steven Pelley, David Meisner, Pooya Zandevakili, T...
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
We examine the use of a hop-limit constraint with techniques to provide survivability for connection-oriented ATM group communications. A hop-limit constraint is an approach that ...
Scaling of CMOS feature size has long been a source of dramatic performance gains. However, the reduction in voltage levels has not been able to match this rate of scaling, leadin...
Shantanu Gupta, Shuguang Feng, Amin Ansari, Jason ...