Since process and environmental variations can no longer be ignored in high-performance microprocessor designs, it is necessary to develop techniques for computing the sensitiviti...
Sanjay V. Kumar, Chandramouli V. Kashyap, Sachin S...
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...
Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...
Abstract. Monte Carlo simulation is one of the most widely used techniques for computationally intensive simulations in mathematical analysis and modeling. A multivariate Gaussian ...
Abstract—We develop and evaluate a new method for estimating and optimizing various performance metrics for multihop wireless networks, including MANETs. We introduce an approxim...
John S. Baras, Vahid Tabatabaee, George Papageorgi...