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DAC
2003
ACM
14 years 2 months ago
Test application time and volume compression through seed overlapping
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
Wenjing Rao, Ismet Bayraktaroglu, Alex Orailoglu
ATS
2003
IEEE
131views Hardware» more  ATS 2003»
14 years 3 months ago
Software-Based Delay Fault Testing of Processor Cores
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hi...
DATE
2008
IEEE
174views Hardware» more  DATE 2008»
14 years 4 months ago
Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment
Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more importa...
Mustafa Badaroglu, Guy Decabooter, Francois Laulan...
IPPS
1999
IEEE
14 years 2 months ago
A Structured Approach to Parallel Programming: Methodology and Models
Parallel programming continues to be difficult, despite substantial and ongoing research aimed at making it tractable. Especially dismaying is the gulf between theory and the pract...
Berna L. Massingill
IIE
2008
123views more  IIE 2008»
13 years 9 months ago
A Methodological Review of the Program Evaluations in K-12 Computer Science Education
Because of the potential for methodological reviews to improve practice, this article presents the results of a methodological review, and meta-analysis, of kindergarten through 12...
Justus J. Randolph