A new method for predicting timing jitter caused by device noise in current-mode logic (CML) frequency dividers is presented. Device noise transformation into jitter is modeled as ...
Marko Aleksic, Nikola Nedovic, K. Wayne Current, V...
Abstract-- The projection data measured in computed tomography (CT) and, consequently, the slices reconstructed from these data are noisy. We present a new wavelet based structurep...
Anja Borsdorf, Rainer Raupach, Thomas Flohr, Joach...
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
The application of bit-interleaved coded modulation with iterative decoding (BICM-ID) was recently considered to improve both the spectral efficiency and error performance in Cla...
As technology scales down, power supply noise is becoming a performance and reliability bottleneck in modern VLSI. We propose a power supply noise-aware design methodology for hig...