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DAC
2007
ACM
14 years 8 months ago
Global Critical Path: A Tool for System-Level Timing Analysis
An effective method for focusing optimization effort on the most important parts of a design is to examine those elements on the critical path. Traditionally, the critical path is...
Girish Venkataramani, Mihai Budiu, Tiberiu Chelcea...
VLSID
2006
IEEE
156views VLSI» more  VLSID 2006»
14 years 7 months ago
SEAT-LA: A Soft Error Analysis Tool for Combinational Logic
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
Jungsub Kim, Mary Jane Irwin, Narayanan Vijaykrish...
AICCSA
2008
IEEE
209views Hardware» more  AICCSA 2008»
13 years 9 months ago
Transistor-level based defect tolerance for reliable nanoelectronics
Nanodevices based circuit design will be based on the acceptance that a high percentage of devices in the design will be defective. In this work, we investigate a defect tolerant ...
Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Mel...
CCGRID
2007
IEEE
14 years 1 months ago
Reliability Analysis of Self-Healing Network using Discrete-Event Simulation
The number of processors embedded on high performance computing platforms is continuously increasing to accommodate user desire to solve larger and more complex problems. However,...
Thara Angskun, George Bosilca, Graham E. Fagg, Jel...
KDD
2002
ACM
182views Data Mining» more  KDD 2002»
14 years 7 months ago
ANF: a fast and scalable tool for data mining in massive graphs
Graphs are an increasingly important data source, with such important graphs as the Internet and the Web. Other familiar graphs include CAD circuits, phone records, gene sequences...
Christopher R. Palmer, Phillip B. Gibbons, Christo...