1218 search results - page 166 / 244 » Scaling up a |
ASPDAC
2009
ACM
14 years 4 months ago
2009
ACM
— As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep submicron designs. In the presence of process variations, wo...
ISLPED
2009
ACM
14 years 4 months ago
2009
ACM
Increasing power densities and the high cost of low thermal resistance packages and cooling solutions make it impractical to design processors for worst-case temperature scenarios...
SLIP
2009
ACM
14 years 4 months ago
2009
ACM
The present paper is part of a larger effort to redesign, from the ground up, the best possible interconnect topologies for switchless multiprocessor computer systems. We focus he...
ASAP
2008
IEEE
14 years 4 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
Single-electron devices have drawn much attention in the last two decades. They have been widely used for device research and also show promise as a potential alternative to compl...