61 search results - page 8 / 13 » Scan chain clustering for test power reduction |
TC
2008
13 years 7 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
TODAES
2011
13 years 2 months ago
2011
—In this paper, we present an attack on stream cipher implementations by determining the scan chain structure of the linear feedback shift registers in their implementations. Alt...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...