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EVOW
2001
Springer
15 years 10 months ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
ITC
1998
IEEE
120views Hardware» more  ITC 1998»
15 years 10 months ago
Test generation in VLSI circuits for crosstalk noise
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer
ITC
1997
IEEE
73views Hardware» more  ITC 1997»
15 years 10 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
142
Voted
GECCO
2006
Springer
133views Optimization» more  GECCO 2006»
15 years 9 months ago
A general coarse-graining framework for studying simultaneous inter-population constraints induced by evolutionary operations
The use of genotypic populations is necessary for adaptation in Evolutionary Algorithms. We use a technique called form-invariant commutation to study the immediate effect of evol...
Keki M. Burjorjee, Jordan B. Pollack
170
Voted
KDD
2000
ACM
97views Data Mining» more  KDD 2000»
15 years 9 months ago
Towards an effective cooperation of the user and the computer for classification
Decision trees have been successfully used for the task of classification. However, state-of-the-art algorithms do not incorporate the user in the tree construction process. This ...
Mihael Ankerst, Martin Ester, Hans-Peter Kriegel