376 search results - page 23 / 76 » Self-Assembled Circuit Patterns |
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
A new jitter model is developed using Matlab and Spice to analyze Data Dependent Jitter (DDJ) in serial data integrated circuits. The simulation results show that DDJ is dependent...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
VTS
1995
IEEE
13 years 11 months ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
HPCA
2009
IEEE
14 years 2 months ago
2009
IEEE
While parallelism and multi-cores are receiving much attention as a major scalability path, customization is another, orthogonal and complementary, scalability path which can targ...
ICCAD
2002
IEEE
14 years 4 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...