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DAC
2003
ACM
14 years 26 days ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
NN
2000
Springer
142views Neural Networks» more  NN 2000»
13 years 7 months ago
Towards a neural network based therapy for hallucinatory disorders
Pattern completion in a neural network model of the thalamus and a biologically plausible model of synaptic plasticity are the key concepts used in this paper for analyzing some c...
Javier Ropero Peláez
ICANN
2007
Springer
14 years 1 months ago
Neuronal Multistability Induced by Delay
Abstract. Feedback circuits are important for understanding the emergence of patterns of neural activity. In this contribution we study how a delayed circuit representing a recurre...
Cristina Masoller, M. C. Torrent, Jordi Garc&iacut...
DSD
2006
IEEE
93views Hardware» more  DSD 2006»
14 years 1 months ago
High-Level Decision Diagram based Fault Models for Targeting FSMs
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
Jaan Raik, Raimund Ubar, Taavi Viilukas
ATS
2010
IEEE
250views Hardware» more  ATS 2010»
13 years 4 months ago
Efficient Embedding of Deterministic Test Data
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson,...