Current Static Timing Analysis (STA) techniques allow one to verify the timing of a circuit at different process corners which only consider cases where all the supplies are low o...
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
With aggressive gate oxide scaling, latent defects in the gate oxide manifest as traps that, in time, lead to gate oxide breakdown. Progressive gate oxide breakdown, also referred...
—With the scaling of complementary metal–oxide– semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacit...
In this paper, we study the propagation of slew dependent bounding signals and the corresponding slew problem in static timing analysis. The selection of slew from the latest arri...
Jin-fuw Lee, Daniel L. Ostapko, Jeffery Soreff, C....