225 search results - page 26 / 45 » Sequential Circuits for Relational Analysis |
ICCAD
2005
IEEE
14 years 6 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
LCPC
2009
Springer
14 years 2 months ago
2009
Springer
Abstract. Current hardware trends place increasing pressure on programmers and tools to optimize scientific code. Numerous tools and techniques exist, but no single tool is a pana...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
ICCAD
2002
IEEE
14 years 6 months ago
2002
IEEE
Within the verification community, there has been a recent increase in interest in Quantified Boolean Formula evaluation (QBF) as many interesting sequential circuit verification ...