755 search results - page 8 / 151 » Sequential Diagnosis by Abstraction |
AIPS
2007
13 years 10 months ago
2007
ICCAD
1997
IEEE
13 years 12 months ago
1997
IEEE
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is applicable to combinational ...
ASPDAC
2004
ACM
14 years 1 months ago
2004
ACM
— We examine an abstract formulation of BIST diagnosis in digital logic systems. The BIST diagnosis problem has applications that include identification of erroneous test vector...
DFT
2003
IEEE
14 years 28 days ago
2003
IEEE
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...