27 search results - page 1 / 6 » Simulation and Development of Short Transparent Tests for RA... |
ATS
2001
IEEE
14 years 2 months ago
2001
IEEE
VLSID
2001
IEEE
14 years 11 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
CNSR
2006
IEEE
14 years 5 months ago
2006
IEEE
The deployment of Reconfigurable Optical Add/Drop Multiplexers (ROADMs) is going to change the conventional architecture for metro networks. In this paper, we present detailed fea...
ICDCS
2008
IEEE
14 years 5 months ago
2008
IEEE
The multi-level storage architecture has been widely adopted in servers and data centers. However, while prefetching has been shown as a crucial technique to exploit the sequentia...
ICCAD
2000
IEEE
14 years 3 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...