913 search results - page 16 / 183 » Simulation based design for a shipyard manufacturing process |
DATE
2010
IEEE
14 years 18 days ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
Modern CMOS manufacturing processes have significant variability, which necessitates guard banding to achieve reasonable yield. We study an FPGA architecture with a dual voltage s...
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
WSC
2000
13 years 8 months ago
2000
Designing semiconductor cluster tool systems is a complicated task due to the nature of automatic operations and various configurations of modules and task response priorities of ...
TVLSI
2010
13 years 2 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...