913 search results - page 16 / 183 » Simulation based design for a shipyard manufacturing process |
142
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
117
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DAC
2008
ACM
16 years 5 months ago
2008
ACM
Modern CMOS manufacturing processes have significant variability, which necessitates guard banding to achieve reasonable yield. We study an FPGA architecture with a dual voltage s...
147
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ISQED
2008
IEEE
15 years 10 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
126
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WSC
2000
15 years 5 months ago
2000
Designing semiconductor cluster tool systems is a complicated task due to the nature of automatic operations and various configurations of modules and task response priorities of ...
166
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TVLSI
2010
14 years 10 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...