The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael ...
Fourth-generation wireless communication systems (4G) will have totally different requirements than what front-end designers have been coping with up to now. Designs must be targe...
To ensure the power and signal integrity of modern VLSI circuits, it is crucial to analyze huge amount of nonlinear devices together with enormous interconnect and even substrate ...
A new algorithm is presented that combines performance and variation objectives in a behavioural model for a given analogue circuit topology and process. The tradeoffs between per...
Sawal Ali, Reuben Wilcock, Peter R. Wilson, Andrew...
This paper presents a compact Nonlinear model Order Reduction Method (NORM) that is applicable for time-invariant and time-varying weakly nonlinear systems. NORM is suitable for r...