Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
—— Hybrid semiconductor/nanodevice (“CMOL”) technology may allow the implementation of digital and mixed-signal integrated circuits, including artificial neural networks (...
This paper presents a fully integrated 1-V, dual band, fastlocked frequency synthesizer for IEEE 802.11 a/b/g WLAN applications. It can synthesize frequencies in the range of 2.4 ...
Increasing dynamic variability with technology scaling has made it essential to incorporate large design-time timing margins to ensure yield and reliable operation. Online techniq...
Mihir R. Choudhury, Vikas Chandra, Kartik Mohanram...
Critical systems like pace-makers, defibrillators, wearable computers and other electronic gadgets have to be designed not only for reliability but also for ultra-low power consu...