—Piezoelectric materials have been proposed as embedded power source, which are capable of converting mechanical energy into electrical energy. However, power generated from a pi...
Hong Chen, Chen Jia, Chun Zhang, Zhihua Wang, Chun...
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong ...
Distributed sensor networks, human body implants, and hand-held electronics have tight energy budgets that necessitate low power circuits. Most of these devices include an analog-...
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...