1304 search results - page 176 / 261 » Simulation of Soliton Circuits |
ISCAS
2007
IEEE
14 years 3 months ago
2007
IEEE
—Piezoelectric materials have been proposed as embedded power source, which are capable of converting mechanical energy into electrical energy. However, power generated from a pi...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
ASYNC
2006
IEEE
14 years 3 months ago
2006
IEEE
Distributed sensor networks, human body implants, and hand-held electronics have tight energy budgets that necessitate low power circuits. Most of these devices include an analog-...
ISQED
2006
IEEE
14 years 2 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
GLVLSI
2005
IEEE
14 years 2 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...