Three dimensional vertically integrated systems allow active devices to be placed on multiple device layers. In recent years, a number of research efforts have addressed physical ...
NBTI (Negative Bias Temperature Instability) has emerged as the dominant failure mechanism for PMOS in nanometer IC designs. However, its impact on one of the most important compo...
—Valiant load balancing (VLB), also called two-stage load balancing, is gaining popularity as a routing scheme that can serve arbitrary traffic matrices. To date, VLB network de...
Processors progressively age during their service life due to normal workload activity. Such aging results in gradually slower circuits. Anticipating this fact, designers add timi...
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...