205 search results - page 4 / 41 » SoC Design and Test Considerations |
VTS
2007
IEEE
14 years 29 days ago
2007
IEEE
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
DAC
2001
ACM
14 years 7 months ago
2001
ACM
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
ET
2002
13 years 6 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
ITC
1989
IEEE
13 years 10 months ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
ISQED
2009
IEEE
14 years 1 months ago
2009
IEEE
Active decoupling capacitors (decaps) are more effective than passive decaps at reducing local IR-drop problems in the power distribution network. In the basic active decap, two p...