—Mounting concerns over variability, defects and noise motivate a new approach for digital circuitry: stochastic logic, that is to say, logic that operates on probabilistic signa...
Weikang Qian, Xin Li, Marc D. Riedel, Kia Bazargan...
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
Dinesh Patil, Sunghee Yun, Seung-Jean Kim, Alvin C...
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...
Brian Mullins, Hossein Asadi, Mehdi Baradaran Taho...