98 search results - page 12 / 20 » Soft error rate analysis for sequential circuits |
PR
2010
13 years 6 months ago
2010
Wavelet analysis has found widespread use in signal processing and many classification tasks. Nevertheless, its use in dynamic pattern recognition have been much more restricted ...
ASAP
2008
IEEE
14 years 2 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— Fault injection has become a very classical method to determine the dependability of an integrated system with respect to soft errors. Due to the huge number of possible error ...
MICRO
2006
IEEE
13 years 7 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...