32 search results - page 2 / 7 » Soft-Error Tolerance Analysis and Optimization of Nanometer ... |
HPCA
2009
IEEE
14 years 2 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
LCTRTS
2009
Springer
14 years 2 months ago
2009
Springer
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...
LCTRTS
2010
Springer
14 years 17 days ago
2010
Springer
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at e...