32 search results - page 4 / 7 » Soft-Error Tolerance Analysis and Optimization of Nanometer ... |
DAC
2006
ACM
14 years 1 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
TC
2011
13 years 2 months ago
2011
—Mounting concerns over variability, defects and noise motivate a new approach for digital circuitry: stochastic logic, that is to say, logic that operates on probabilistic signa...
TVLSI
2008
13 years 7 months ago
2008
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for high-performance VLSI des...
MICRO
2006
IEEE
13 years 7 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
Mounting concerns over variability, defects and noise motivate a new approach for integrated circuits: the design of stochastic logic, that is to say, digital circuitry that opera...