32 search results - page 6 / 7 » Soft-Error Tolerance Analysis and Optimization of Nanometer ... |
IOLTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
EUROGP
2009
Springer
14 years 12 days ago
2009
Springer
The contribution presented herein proposes an adaptive genetic algorithm applied to quantum logic circuit synthesis that, dynamically adjusts its control parameters. The adaptation...