4207 search results - page 78 / 842 » Stable Analysis Patterns |
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use clus...
HASE
2005
IEEE
14 years 1 months ago
2005
IEEE
Aspect-oriented modeling is proposed to design the architecture of fault tolerant systems. Notations are introduced that support the separate and modularized design of functional ...
LOPSTR
1994
Springer
14 years 7 days ago
1994
Springer
A technique for transformation of definite logic programs is presented. A first phase performs an analysis of the extended call/exit patterns of the source program. It is shown tha...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
ICWL
2010
Springer
13 years 6 months ago
2010
Springer
Abstract. This paper describes a pedagogical pattern for cross-cultural language learning and its application in a case study involving learners in Australia and China. The pattern...