390 search results - page 11 / 78 » State of the art in testing components |
IV
2003
IEEE
14 years 1 months ago
2003
IEEE
In this paper we present a “lightweight” visual formalism that can be used to examine the state space complexity of an interface. The method can form a basis for designing, te...
FPL
2011
Springer
12 years 7 months ago
2011
Springer
In this paper two compact hardware structures for the computation of the CLEFIA encryption algorithm are presented. One structure based on the existing state of the art and a nove...
CSREAESA
2008
13 years 9 months ago
2008
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
VTS
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word coupling faults. Then, it establi...
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
Database systems play an important role in nearly every modern organization, yet relatively little research effort has focused on how to test them. AGENDA, A (test) GENerator for ...