125 search results - page 1 / 25 » Static Estimation of Test Coverage |
SCAM
2009
IEEE
14 years 5 months ago
2009
IEEE
CASCON
1996
14 years 7 days ago
1996
The estimation of reliability of modules using code coverage is motivated by a two-phase method for estimating the quality of software using static structure and predicted quality...
GLVLSI
1999
IEEE
14 years 3 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
VTS
2002
IEEE
14 years 3 months ago
2002
IEEE
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...
ATS
2003
IEEE
14 years 4 months ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...