125 search results - page 4 / 25 » Static Estimation of Test Coverage |
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise est...
HASE
1998
IEEE
13 years 11 months ago
1998
IEEE
Residual defects is one of the most important factors that allow one to decide if a piece of software is ready to be released. In theory, one can find all the defects and count th...
ICCAD
1990
IEEE
13 years 11 months ago
1990
IEEE
Partial detectability profiles are formed by randomly sampling each fault's detectability and are used in estimating the fault coverage of random input test vectors on combin...
ICSE
2009
IEEE-ACM
14 years 8 months ago
2009
IEEE-ACM
A variety of compilers, static analyses, and testing frameworks rely heavily on path frequency information. Uses for such information range from optimizing transformations to bug ...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...