1599 search results - page 30 / 320 » Statistic Analysis for Probabilistic Processes |
DAC
2004
ACM
14 years 10 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
COLT
2006
Springer
14 years 25 days ago
2006
Springer
We propose a sequential randomized algorithm, which at each step concentrates on functions having both low risk and low variance with respect to the previous step prediction functi...
ASPDAC
2008
ACM
13 years 11 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
ISCAS
2005
IEEE
14 years 2 months ago
2005
IEEE
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
ICCAD
2005
IEEE
14 years 6 months ago
2005
IEEE
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a “device file setting” ...