The increasing size of integrated systems combined with deep submicron physical modeling details creates an explosion in RLC interconnect modeling complexity of unmanageable propo...
Michael W. Beattie, Satrajit Gupta, Lawrence T. Pi...
Models meant for logic verification and simulation are often used for ATPG. For custom digital circuits, these models contain many tristate devices, which leads to lower fault co...
— A substrate-coupling equivalent circuit can be derived for an arbitrary guard ring test structure by way of F-matrix computation. The derived netlist represents a unified impe...
Abstract— A fast timing analysis of plane circuits via two-layer CNNbased modeling, which is necessary for the solution of power/signal integrity problems in printed circuit boar...
In this paper, we propose new models for directly evaluating DPA leakage from logic information in CMOS circuits. These models are based on the transition probability for each gate...