246 search results - page 5 / 50 » Statistical gate sizing for timing yield optimization |
ICCAD
2004
IEEE
14 years 4 months ago
2004
IEEE
In this paper, we have analyzed ond modeled the fiilure probabilities ofSRAM cells due to process parameter variations. A method to predict the yield of a memoiy chip based on the...
ISPD
2003
ACM
14 years 24 days ago
2003
ACM
Delay evaluation is always a crucial concern in the VLSI design and it becomes increasingly more critical in the nowadays deep-submicron technology. To obtain an accurate delay va...
TVLSI
2008
13 years 7 months ago
2008
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
JCO
2011
13 years 2 months ago
2011
Discrete gate sizing is a critical optimization in VLSI circuit design. Given a set of available gate sizes, discrete gate sizing problem asks to assign a size to each gate such th...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
In this paper, we propose a new sensitivity based, statistical gate sizing method. Since circuit optimization effects the entire shape of the circuit delay distribution, it is dif...