2286 search results - page 1 / 458 » Statistical timing analysis based on a timing yield model |
DAC
2004
ACM
14 years 11 months ago
2004
ACM
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
ISCAS
2005
IEEE
14 years 4 months ago
2005
IEEE
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
ICCAD
2005
IEEE
14 years 7 months ago
2005
IEEE
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a “device file setting” ...
ICCAD
2005
IEEE
14 years 7 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
TVLSI
2008
13 years 10 months ago
2008
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...