871 search results - page 151 / 175 » Streaming Reduction Circuit |
ASPDAC
2004
ACM
14 years 3 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
CSCLP
2004
Springer
14 years 3 months ago
2004
Springer
We introduce a framework for studying and solving a class of CSP formulations. The framework allows constraints to be expressed as linear and nonlinear equations, then compiles th...
GLVLSI
2003
IEEE
14 years 3 months ago
2003
IEEE
Power-awareness indicates the scalability of the system energy with changing conditions and quality requirements. Multipliers are essential elements used in DSP applications and c...
DAC
2003
ACM
14 years 3 months ago
2003
ACM
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
ISLPED
2003
ACM
14 years 3 months ago
2003
ACM
Power dissipation is unevenly distributed in modern microprocessors leading to localized hot spots with significantly greater die temperature than surrounding cooler regions. Exc...