6014 search results - page 76 / 1203 » Structural Testing with Use Cases |
ICCAD
1994
IEEE
14 years 2 months ago
1994
IEEE
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...
ACE
2004
13 years 11 months ago
2004
In order to teach object-oriented design and programming in introductory computer science it is imperative to teach objects from the very beginning of the course. The use of inter...
ISSRE
2003
IEEE
14 years 3 months ago
2003
IEEE
Prior research has suggested that the failure rates of faults follow a log normal distribution. We propose a specific model where distributions close to a log normal arise natural...
ISSTA
2006
ACM
14 years 4 months ago
2006
ACM
Existing test suite reduction techniques employed for testing web applications have either used traditional program coverage-based requirements or usage-based requirements. In thi...
TAICPART
2010
IEEE
13 years 8 months ago
2010
IEEE
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is...