—We present an efficient approach for on-chip frequency response measurement, including phase and gain, of analog circuitry in mixed-signal systems. The approach uses direct digi...
In this paper we describe a technique for efficient parallelization of digital wave guide network (DWN) models based on an interpretation of the finite difference time domain (F...
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurement...
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...
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