171 search results - page 12 / 35 » Synthesis of Efficient Linear Test Pattern Generators |
ITC
1997
IEEE
14 years 1 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
CGF
2002
13 years 9 months ago
2002
Texture mapping has become indispensable in image synthesis as an inexpensive source of rich visual detail. Less obvious, but just as useful, is its ability to mask image errors d...
PRL
2010
13 years 3 months ago
2010
For fast classification under real-time constraints, as required in many imagebased pattern recognition applications, linear discriminant functions are a good choice. Linear discr...