This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
Christophe Fagot, Patrick Girard, Christian Landra...
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
Texture mapping has become indispensable in image synthesis as an inexpensive source of rich visual detail. Less obvious, but just as useful, is its ability to mask image errors d...
Bruce Walter, Sumanta N. Pattanaik, Donald P. Gree...
For fast classification under real-time constraints, as required in many imagebased pattern recognition applications, linear discriminant functions are a good choice. Linear discr...