171 search results - page 19 / 35 » Synthesis of Efficient Linear Test Pattern Generators |
ISCAS
2007
IEEE
14 years 3 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
MCS
2010
Springer
13 years 7 months ago
2010
Springer
Besides speed and period length, the quality of uniform random number generators is usually assessed by measuring the uniformity of their point sets, formed by taking vectors of s...
JNW
2006
13 years 9 months ago
2006
A number of Integer Linear Program (ILP) formulations for both static and dynamic lightpath allocation have been proposed, for the design of survivable WDM networks. However, such ...
ASPDAC
2004
ACM
14 years 2 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
DFT
2003
IEEE
14 years 2 months ago
2003
IEEE
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...