46 search results - page 8 / 10 » Techniques for Verifying Superscalar Microprocessors |
DSN
2002
IEEE
14 years 16 hour ago
2002
IEEE
Concentration of design effort for current single-chip Commercial-Off-The-Shelf (COTS) microprocessors has been directed towards performance. Reliability has not been the primary ...
MICRO
1999
IEEE
13 years 11 months ago
1999
IEEE
Building a high-performance microprocessor presents many reliability challenges. Designers must verify the correctness of large complex systems and construct implementations that ...
ISPASS
2007
IEEE
14 years 1 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
ICCAD
2002
IEEE
14 years 4 months ago
2002
IEEE
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
Embedded computer systems are characterized by the presence of a dedicated processor and the software that runs on it. Power constraints are increasingly becoming the critical com...