82 search results - page 3 / 17 » Techniques to Reduce Data Volume and Application Time for Tr... |
ITC
2002
IEEE
14 years 13 days ago
2002
IEEE
1 This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The techni...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
ITC
2002
IEEE
14 years 13 days ago
2002
IEEE
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...