82 search results - page 7 / 17 » Techniques to Reduce Data Volume and Application Time for Tr... |
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
TVLSI
2008
13 years 7 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
ITC
2003
IEEE
14 years 24 days ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
DATE
2003
IEEE
14 years 25 days ago
2003
IEEE
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
PAKDD
2007
ACM
14 years 1 months ago
2007
ACM
The shear volume of the results in traditional support based frequent sequential pattern mining methods has led to increasing interest in new intelligent mining methods to find mo...