Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...