1016 search results - page 116 / 204 » Test Generation for Designs with On-Chip Clock Generators |
GPEM
2006
13 years 9 months ago
2006
Abstract. Bedau et al.'s statistical classification system for long-term evolutionary dynamics provides a test for open-ended evolution. Making this test more rigorous, and pa...
DAC
2003
ACM
14 years 10 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
CANDC
2009
ACM
14 years 3 months ago
2009
ACM
Subliminal Wiretapping is a subtly interactive artwork that utilizes random number generation modified through mindmatter effects to supply a continuous stream of words. Frequent,...
DAC
2007
ACM
14 years 1 months ago
2007
ACM
We present a framework for validating the compliance of a design with a given architecture. Our approach is centered on the concept of misinterpretations. These include missing be...
TNN
2008
13 years 9 months ago
2008
Abstract--The stationarity requirement for the process generating the data is a common assumption in classifiers' design. When such hypothesis does not hold, e.g., in applicat...