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ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
— Although the LUT (look-up table) size of FPGAs has been optimized for general applications, complicated designs may contain a large number of cascaded LUTs between flip-flops...
ICALT
2008
IEEE
14 years 2 months ago
2008
IEEE
The goal of this work is the design and construction of adaptive tutorials based on the application of algorithms for the automatic resolution of problems which can be used to aut...
WMC
2004
13 years 9 months ago
2004
: Testing of a software application serves the accomplishment of two dis tinct objectives: ensuring functionality and end-user acceptance. However, with an increasing desire for mo...
ICST
2008
IEEE
14 years 2 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...