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DAC
2006
ACM
14 years 8 months ago
Gain-based technology mapping for minimum runtime leakage under input vector uncertainty
The gain-based technology mapping paradigm has been successfully employed for finding minimum delay and minimum area mappings. However, existing gain-based technology mappers fail...
Ashish Kumar Singh, Murari Mani, Ruchir Puri, Mich...
TVLSI
2008
140views more  TVLSI 2008»
13 years 7 months ago
A Novel Mutation-Based Validation Paradigm for High-Level Hardware Descriptions
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
Jorge Campos, Hussain Al-Asaad
ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
13 years 12 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
COLING
2010
13 years 2 months ago
Unsupervised Discriminative Language Model Training for Machine Translation using Simulated Confusion Sets
An unsupervised discriminative training procedure is proposed for estimating a language model (LM) for machine translation (MT). An English-to-English synchronous context-free gra...
Zhifei Li, Ziyuan Wang, Sanjeev Khudanpur, Jason E...
ICIAR
2009
Springer
14 years 8 days ago
Abnormal Behavior Recognition Using Self-Adaptive Hidden Markov Models
A self-adaptive Hidden Markov Model (SA-HMM) based framework is proposed for behavior recognition in this paper. In this model, if an unknown sequence cannot be classified into an...
Jun Yin, Yan Meng