46 search results - page 1 / 10 » Test Requirement Analysis for Low Cost Hierarchical Test Pat... |
ATS
2002
IEEE
14 years 10 days ago
2002
IEEE
We propose a methodology that examines design modules and identifies appropriate vector justification and response propagation requirements for hierarchical test. Based on a cel...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
INFOCOM
2003
IEEE
14 years 19 days ago
2003
IEEE
— There is a growing interest among service providers to offer new services with Quality of Service (QoS) guaranties that are also resilient to failures. Supporting QoS connectio...