12 search results - page 1 / 3 » Test Scheduling and Scan-Chain Division under Power Constrai... |
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
ITC
2003
IEEE
14 years 19 days ago
2003
IEEE
Scan-based architectures, though widely used in modern designs, are expensive in power consumption. In this paper, we present a new technique that allows to design power-optimized...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
Abstract— For scan-based testing, the high test power consumption may cause test power management problems, and the extra scan chain connections may cause routability degradation...
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
1 We propose an integrated technique for extensive optimization of the final test solution for System-on-Chip using Simulated Annealing. The produced results from the technique ar...